Products for Surface Analysis
Surface Analysis Applications
Surface analysis supports applied surface science workflows where researchers need to understand composition, contamination, depth profiles, isotopic information or material behaviour at and near the surface of a sample. Hiden Analytical supports applications across plasma characterisation, thin film optical coating, FIB-SIMS and semiconductor etch optimisation.
Compact SIMS
The Hiden Compact SIMS (secondary ion mass spectrometry) has a low form factor and simple, user-friendly layout, with outstanding isotopic sensitivity across the entire periodic table.
AutoSIMS
A robust surface analysis solution for high throughput operations, the AutoSIMS can perform hundreds of processes a day without operator intervention.
SIMS Workstation
The SIMS Workstation combines dynamic and static SIMS analysis with a dual-mode mass spectrometer for positive (+ve) and negative (-ve) ion detection, and an additional secondary neutral mass spectrometry (SNMS) detection mode, for superior flexibility in surface analysis applications.
ToF-qSIMS Workstation
The Hiden TOF-qSIMS system is designed for surface analysis and depth profiling applications of a wide range of materials including polymers, pharmaceuticals, superconductors, semiconductors, alloys, optical and functional coatings and dielectrics, with measurement of trace components to sub-ppm levels.
Dual Polarity SIMS Workstation
The Hiden Dual Polarity SIMS Workstation uniquely captures positive and negative secondary ions simultaneously, delivering a complete chemical profile in a single run. Using dual opposing EQS spectrometers for enhanced collection efficiency. Compatible with all ion guns, it provides fast, accurate results for applications from solar cells and oxides to dopants and trace impurities.
EQS SIMS Analyser
With high transmission rates and an integrated 45° electrostatic sector energy analyser, the Hiden EQS (electrostatic quadrupole) is a versatile positive and negative ion SIMS detector for surface analysis applications at the nanoscale.
MAXIM
The Hiden MAXIM is a complete quadrupole mass spectrometry system with high transmission optics and a triple mass filter, supporting detailed surface composition mapping at a mass range of up to 1000 atomic mass units (AMU).
IG5C
The IG5C features a low power, high brightness, surface ionization source coupled to a compact ion column, providing high performance in a small package. The IG5C is designed as a primary ion beam for all SIMS applications, dynamic, static and imaging.
IG20
Designed primarily for oxygen compatibility, the Hiden IG20 is a high-performance electron impact ion source with a high current density for an intense spot of just 100 micrometres (µm) in diameter.
Modular SIMS
Add high performance SIMS capability to your surface analysis chamber.
Custom SIMS Solutions
The modular nature of Hiden products allows us to efficiently custom design instruments for specific applications and locations.
XPS for SIMS
A multi-technique UHV surface science system option providing for XPS, UPS, AES, SAM, ISS and LEIS installed on the Hiden SIMS Workstation.
What is Surface Analysis?
Surface analysis is the study of the chemical composition, structure or distribution of species at or near a material surface. Surface analysis techniques such as SIMS, SNMS, depth profiling, surface imaging, and mass spectra collection can support the investigation of surface composition, thin films, dopants, isotopes, contaminants, and material layers.
The application of surface analysis is important in cases where mass spectrometry-based surface analysis equipment can provide insight into the chemistry of the upper surface or near-surface region.
- Electronics
- Semiconductors
- Battery research
- Medical devices
- Pharmaceuticals
- Solar cells
- Advanced materials research
Applied Surface Science Applications
Hiden supports applied surface science and surface analysis applications across materials research, product development, and quality-led investigation workflows, including:
- SIMS and SNMS surface analysis
- FIB-SIMS for nanoscale materials analysis
- Contamination with silicone
- Electronic materials surface analysis
- Flexible solar cell depth profiling
- Isotopically labelled materials analysis
- Surgical stent surface analysis
- SNMS of magnetic storage materials
- Nuclear materials surface analysis
- Pharmaceutical surface analysis
- Battery research surface analysis
- Contamination analysis
These applications can support analysis of:
- Semiconductors
- Electronic materials
- Thin films
- Solar cell materials
- Battery materials
- Medical devices
- Polymers
- Pharmaceutical powders
- Magnetic storage materials
- Nuclear materials
- Isotopically labelled materials
- Contaminated surfaces
Where equipment selection is required, Hiden’s surface analysis equipment range can help users compare suitable SIMS, SNMS and related system options.
