Release Number: HAPR0271
Release Date: Immediate release
Hiden Analytical has published a technical article exploring how Secondary Ion Mass Spectrometry, SIMS, can support isotope ratio analysis and depth-resolved characterisation of enriched medical isotope target materials.
The article explains why enriched isotope targets are important in medical radioisotope production research, and how SIMS can help researchers assess isotope distribution, surface composition, contamination and depth variation in scarce or high-value solid materials.
A key focus is the ability of SIMS to preserve spatial and depth information. Unlike bulk isotope analysis, which provides an averaged composition, SIMS can show how isotope distribution varies across a surface, through a deposited layer or within a depth profile.
The article also highlights Hiden Analytical’s AutoSIMS as a compact, automated route to routine SIMS analysis for laboratories working with deposited layers, thin films and enriched isotope target materials.
“Enriched isotope targets are often valuable, limited in quantity and highly application-specific,” says Graham Cooke, Principal Scientist at Hiden Analytical. “SIMS provides a direct way to examine isotope distribution in the solid material itself, while retaining the spatial and depth information that can be lost in bulk measurements.”
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This press release provides a short summary of the application. The full technical article gives further background on medical radioisotope production, enriched stable isotope targets, isotope ratio measurement and the role of SIMS in target characterisation: SIMS Measurement of Isotope Ratios in Enriched Medical Isotope Targets
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Download press release PDF [Release Number: HAPR0271]
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About Hiden Analytical
Hiden Analytical has more than 40 years of experience in the design, development and manufacture of quadrupole mass spectrometers for advanced research applications and specialist process monitoring. Based in the UK, Hiden Analytical supplies mass spectrometry solutions for gas analysis, catalysis, thermal analysis, electrochemistry, plasma diagnostics, residual gas analysis, surface science and related research fields.
