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SIMS Surface Analysis and SNMS Surface Analysis

For further information and pricing, please get in touch with us.

For the determination of surface composition, contaminant analysis and depth profiling

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Overview

SIMS is a high sensitivity surface analysis technique for the determination of surface composition, contaminant analysis and for depth profiling in the uppermost surface layers of a sample.

Applied to analysis within the first few microns of a surface, Hiden’s SIMS systems provide depth profiles with depth resolution to 2 nanometres.

The Hiden SIMS Workstation provides for high performance static and dynamic SIMS applications for detailed surface composition analysis and depth profiling.

Hiden’s elemental SIMS imaging facility provides for high resolution surface chemical mapping.

Hiden Bolt-On Components are available for upgrading existing surface analysis equipment with SIMS facilities.

Further Reading

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Interaction of molecular oxygen ions with copper surface: features of the energy spectra of sputtered and backscattered ions 511.39 KB 138 downloads

Interaction of molecular oxygen ions with copper surface: features of the energy...
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P-type conductivity in Sn-doped Sb2 Se3 2.64 MB 134 downloads

P-type conductivity in Sn-doped Sb2 Se3 ...
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Controlling Li Dendritic Growth in Graphite Anodes by Potassium Electrolyte Additives for Li-Ion Batteries 3.75 MB 171 downloads

Controlling Li Dendritic Growth in Graphite Anodes by Potassium Electrolyte Additives...
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Robust nonfullerene solar cells approaching unity external quantum efficiency enabled by suppression of geminate recombination 1.05 MB 138 downloads

Robust nonfullerene solar cells approaching unity external quantum efficiency...
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Mitigating Structural Instability of High-Energy Lithium- and Manganese-Rich LiNixMnyCoz Oxide by Interfacial Atomic Surface Reduction 4.22 MB 135 downloads

Mitigating Structural Instability of High-Energy Lithium- and Manganese-Rich LiNixMnyCoz...
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Towards x-ray waveguide formation upon ion irradiation of a Co thin film on Si(111) 1,011.83 KB 130 downloads

Towards x-ray waveguide formation upon ion irradiation of a Co thin film on Si(111) ...
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Analysis of useful ion yield for the Mg dopant in GaN by quadrupole—SIMS 1.03 MB 81 downloads

Analysis of useful ion yield for the Mg dopant in GaN by quadrupole—SIMS ...
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Large area visualization of the Li distribution in lithium-ion battery electrodes using plasma FIB and SIMS 384.40 KB 73 downloads

Large area visualization of the Li distribution in lithium-ion battery electrodes...
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Low-frequency plasma activation of nylon 6 - Download 2.63 MB 71 downloads

Low-frequency plasma activation of nylon 6 ...
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Wafer-level uniformity of atomic-layer-deposited niobium nitride thin films for quantum devices 1.92 MB 60 downloads

Wafer-level uniformity of atomic-layer-deposited niobium nitride thin films for...