Hiden Analytical will be attending the UK Semiconductors Conference 2026 taking place 1-2 July 2026 at Sheffield Hallam University in Sheffield, UK. Representing us will be Colin Robertson, who will be on-site to showcase how Hiden’s instrumentation supports fundamental physics and material development.
UK Semiconductors 2026 is positioned as the UK’s largest annual semiconductor-research meeting, to cover the full semiconductor R&D stack across materials science, device physics, and engineering. The programme spans epitaxy, fabrication, characterization, and theory for Si, Ge, III–V/III-nitride, II–VI, organic, hybrid, perovskite, nanostructured, and 2D material platforms, alongside topics such as electronic and optical properties, spintronics, quantum information, transport, and device classes ranging from single-electron structures and high-mobility transistors to LEDs, laser diodes, photodetectors, high-power lasers, and photovoltaics. A notable 2026 emphasis is a focus session on metrology for emerging semiconductor materials, targeting advanced characterization, standards, and instrumentation for nanoscale imaging, electrothermal measurements, defect/interface analysis, and metrology integration within fabrication workflows.
What to Expect?
- Positioned as the UK’s largest annual semiconductor research meeting, the UK Semiconductors Conference brings together 300+ delegates and around 50 exhibitors and sponsors across academia, instrumentation, and technology development.
- The conference programme spans the full semiconductor innovation chain, with coverage across materials science, device physics, fabrication, characterisation, and engineering.
- Technical scope includes Si, Ge, III–V and III-nitride materials, II–VI compounds, organic and hybrid semiconductors, perovskites, nanostructures, and 2D materials, reflecting the breadth of current UK semiconductor research.
- Attendees can expect discussion across high-value application domains including optical devices, electronic devices, mid-IR and THz systems, wide-band-gap semiconductors, and advanced semiconductor materials and nanostructures.
- A focus session on semiconductor metrology, alongside the main exhibition, reinforcing the event’s emphasis on measurement, process understanding, and translational research.
Hiden Analytical at UK Semiconductors 2026
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Meet Colin Robertson to discuss how Hiden’s advanced mass spectrometry and surface analysis support semiconductor R&D and production-facing workflows with higher analytical sensitivity and process insight.
- Our semiconductor-relevant capability set includes residual gas analysis for vacuum diagnostics, contamination monitoring, leak detection, and process gas analysis, which are critical for maintaining stable fabrication environments and improving process confidence.
- Visitors will also be able to discuss surface and depth-profiling workflows using SIMS, including high-sensitivity analysis for dopant profiling, contaminant detection, and thin-film characterisation relevant to advanced semiconductor structures.
- Connect measurement capability directly to semiconductor outcomes: better contamination control, stronger process diagnostics, improved material understanding, and more reliable device development pathways.
📅 Event Dates: 1-2 July, 2026.
📍 Location: Sheffield Hallam University, Sheffield, UK.
🔗 Event Website: UK Semiconductors Conference 2026.
We look forward to connecting with the semiconductors community!
🔍 Explore more about our upcoming exhibitions & conferences.
