Description
In this issue :
Customer Research
Using FIB-SIMS to understand tribological changes in an Al-Si automotive alloy subject to transient start-stop velocities. Project Summary by: Dr John C. Walker, National Centre for Advanced Tribology at Southampton (nCATS), University of Southampton, UK
Negative-ion surface production in hydrogen plasmas: modelling of negative-ion energy distribution functions and comparison with experiments. Project Summary by: Dr G illes CARTRY, PIIM, Service 241 Aix Marseille Université, France
Protonated nitrosamide and its potential role in the release of HONO from snow and ice in the dark. Project Summary by: John Sodeau, Department of Chemistry, University College Cork, Ireland
Mass spectrometer study in time-multiplex SF6+CH4 plasma etching of silicon. Project Summary by: Leandro L. Tezani, Estrada João de Oliveira Remião, Brazil
Products Referenced in this Issue
EPIC Systems for UHV Science Applications. Hiden EPIC mass spectrometers for high precision scientific, process applications and UHV analysis of neutrals, radicals, and ions
EQS 1000 Series SIMS Analyser. The EQS is a secondary ion mass spectrometer bolt on SIMS analyser for the analysis of secondary positive and negative ions from solid samples…
EQP Mass and Energy Analyser. The Hiden EQP is a combined mass / energy Analyser for the analysis of positive AND negative ions, neutrals, and radicals from plasma processes
HPR-30 Vacuum Process Gas Analyser. The HPR-30 process gas analysis system is a compact gas analysis system for monitoring residual gases and vacuum processes…
In the Press
Gas Composition in Vacua. Hiden Analytical offer an extensive range of quadrupole residual gas analysers for diverse vacuum applications through the pressure range from millibar through to extreme high vacuum(XHV)…
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