by hiden | Oct 2, 2016
Surface Analysis under Ambient Conditions Using Plasma-Assisted Desorption/Ionization Mass Spectrometry.
by hiden | Oct 2, 2016
Surface analysis by secondary-ion mass spectroscopy during etching with gas-cluster ion beam.
by hiden | Oct 2, 2016
Sputter depth profiling by secondary ion mass spectrometry coupled with sample current measurements.
by hiden | Oct 2, 2016
Preparation and Characterization of Antimony-Doped Tin Dioxide Electrodes. 3. XPS and SIMS Characterization.
by hiden | Oct 2, 2016
Preferential Oxygen-Trapping in Metallic Multilayers: A SIMS Perspective.
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