Hiden Analytical was recently represented at a specialist seminar hosted by the Vietnam Academy of Science and Technology (VAST) at the Ho Chi Minh University of Science (HCMUS) in Ho Chi Minh City on 24th March 2026. The event, delivered by Dr. Chris Williams, Regional Sales Manager, was organised in collaboration with Hiden’s Vietnamese partner, Reecotech, and brought together academic staff, researchers, and students for a detailed exploration of advanced mass spectrometry techniques and their application across a range of scientific disciplines.
The programme began with an introduction to Hiden Analytical and its instrumentation portfolio, followed by a review of the fundamental principles of mass spectrometry. The session covered applied methodologies, with particular emphasis on evolved gas analysis (EGA) and real-time gas monitoring. These techniques are increasingly critical in the study of thermal decomposition processes, catalytic reactions, and dynamic materials environments, where precise, time-resolved measurement of gaseous species is crucial.
Figure 1. Attendees of the VAST Seminar at the University of Technology, Ho Chi Minh.
A live demonstration of the QGA 2.0 gas analyser formed a central component of the seminar, illustrating the capabilities of quadrupole mass spectrometry for continuous, quantitative gas analysis. The system’s sensitivity, rapid response, and ability to monitor multiple species simultaneously were highlighted in the context of complex experimental conditions. These capabilities are relevant to research areas including energy systems, environmental monitoring, and semiconductor processing, where accurate gas composition data underpins both process understanding and optimisation.
Figure 2. Dr. Chris Williams delivering a presentation on molecular analysis.
A thorough examination of plasma diagnostics provided further technical depth, using Hiden’s ESPion and EQP systems to measure key measurement parameters such as ion energy distributions, plasma potential, and electron temperature, alongside species-resolved plasma composition. These diagnostic tools are integral to the development and control of plasma-based processes, including thin film deposition, etching, and surface modification, which are widely implemented in advanced manufacturing and materials science.
The seminar also explored Secondary Ion Mass Spectrometry (SIMS) applications for surface and near-surface characterisation. Hiden Analytical’s Regional Sales Manager, Dr. Chris Williams, delivered a presentation on methodologies for high-sensitivity elemental and molecular analysis, as well as depth profiling of thin films and multilayer structures. These techniques are especially valuable in the investigation of nanomaterials and semiconductor devices, where compositional precision at the micro- and nanoscale is required. A supporting video presentation gave attendees an insight into SIMS instrumentation and workflow, offering a practical perspective on system operation and analytical capabilities.
Figure 3. Dr. Chris Williams being presented a gift of appreciation from Dr. Nguyen Cong Tranh, Vice-Dean of the Faculty of Chemistry, HCMUS.
The event concluded with an interactive question and answer session, which enabled further discussion of specific applications and analytical challenges. The seminar provided a detailed perspective on the role of advanced mass spectrometry in modern research, with relevance to fields such as semiconductor technology, energy and advanced materials, and supported the development of future research directions.
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